DEFLECTION MEASURING SYSTEM
PMA-6
Deflection/compression measuring system PMA-6
Measuring system for recording the deflection/compression of monolithic ceramic samples under a specified load up to 1700°C for installation in testing machines.
Suitable for compression tests, 3- and 4-point bending tests.
General information
MAYTEC bending measurement systems were specifically developed for use in furnaces at temperatures up to 1700°C. Three-point and four-point bending tests, as well as compression tests, can be performed with a simple mechanical conversion. We use LVDTs or half-bridges with 1 or 5 mm measuring ranges as displacement sensors. The load transfer from the testing machine to the workpiece occurs directly via the measuring device and aluminum.2O3 The tubes (pressure tubes) are mounted on the standard SSIC-machined supports or pressure pistons. The measurement path along the sample is guided through the tube to the sensor in the measuring device via three ceramic probes. We adapt the supports to your sample geometry and the pressure tube lengths to your furnace.
- The system is supplied without cables and preamplifiers for the sensor signal.
- The system also requires a TF amplifier (modulator, demodulator, signal amplifier). This is not included in the scope of delivery.
| Scanning mechanism | Manual |
|---|---|
| Probe finger pressure force | 1…2N (100 … 200g) continuously adjustable |
| Probe finger material | Al2O3, others optional |
| Measuring system | ± 5,0 mm (reset/raise below the sample) |
| Reference button | ± 1,5 mm (adjusting key, blue anodized) |
| Distance of the reference buttons | 20 mm |
| Housing | Aluminum, anodized, stainless steel |
| Weight | Approx. 6 kg |
| Measuring system | ||||
|---|---|---|---|---|
| Article code | -01 HB | -01 LV | -05 HB | -05 LV |
| Measuring principle | Inductive half-bridge | Inductive differential Transform LVDT extension | Inductive half-bridge | Inductive differential Transform LVDT extension |
| Measuring range (linear): in [mm] | ± 1 | ± 1 | ± 5 | ± 5 |
| Resolution: in [μm] | <0,15 | <0,15 | <0,15 | <0,15 |
| Power voltage: in [V] | 1 … . 10 | 1 … . 10 | 1 … . 10 | 1 … . 10 |
| Power supply frequency: [kHz] | 2 … . 20 | 2 … . 20 | 2 … . 20 | 2 … . 20 |
| Signal output: [mV/V/mm] | 83 | 210 | 51 | 105 |
| Permitted system temperature: [°C] | Max. 80 ° C | Max. 80 ° C | Max. 80 ° C | Max. 80 ° C |
Features
- Contact pressure of the buttons can be continuously adjusted between 1 and 2 N.
- Distance between the two reference buttons 20 mm.
- Resolution < 0,15 µm.
- 4 variants: LVDT 1 mm and 5 mm measuring travel, half bridge 1 mm and 5 mm measuring travel.
- Depending on the modification, load capacity up to 10 kN at 1700°C.
Characteristics
- Simple operation thanks to the feed wheel for placing the probe fingers under the sample.
- Quick test readiness.
- Measurement of the deflection using a reference probe finger (2 x outside) to compensate for the thermally induced expansion of the measuring probe finger (1 x center) and to record the deflection within the linear range of the bending moment of the loaded sample.
Thanks to our many years of industry experience, we understand your specific requirements down to the last detail.
In modern testing technology, high-temperature and vacuum furnaces are indispensable: they simulate exact extreme conditions for demanding material tests.
They thus form the foundation for development, quality assurance and research in key industries such as aerospace, automotive, electronics and high-performance materials technology.
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